ARTIFICIAL INTELLIGENCE IN QUALITY CONTROL: A REVIEW OF METHODS, APPLICATIONS, AND EMERGING DIRECTIONS

Authors

  • Mohammed Abbas Abdullah Department of Chemistry, College of Science, University of Mustansiriyah, Baghdad, Iraq
  • Ammar Jawad Taher Department of Chemistry, College of Science, University of Mustansiriyah, Baghdad, Iraq
  • Talib Hussein Abdullah Department of Chemistry, College of Science, University of Mustansiriyah, Baghdad, Iraq

Keywords:

Artificial Intelligence, Quality Control, Deep Learning, Machine Vision, Predictive Maintenance

Abstract

Today, Statistical Process Control (SPC) and manual inspection methods (classical SPC) employed in quality control (QC) can't manage the volume, velocity, and variety of the data generated by production systems. Artificial Intelligence (AI), which encompasses classical machine learning (ML), deep learning (DL), computer vision, generative modeling, and explainable AI (XAI), has become the key factor for automating the quality assurance process in both manufacturing and process industries, making it adaptive and predictive. This review categorizes the application of AI across the lifecycle of the QC process, including the examination of visual defects, prediction of maintenance issues and statistical process control, as well as anomaly detection and document/compliance management. The literature is classified based on the class of the technique and based on industrial sector, that is automotive and general manufacturing, electronics and semiconductors, pharmaceuticals, food processing, construction, with typical benchmark datasets used, performance results, and current issues like lack of data, class imbalance, explanation, and integration. The conclusion of this review states that transformer and convolutional vision models are predominant in defect detection; classical ensemble methods compete well in tabular sensor-based predictive maintenance and SPC; generative models are becoming more popular in tackling the problem of insufficient defects to train models for defect detection, and the need for interpretability is increasing for critical or regulated applications. Future work areas identified are federated and edge learning, human-in-the-loop inspection, and cross-sector benchmarking.

References

“Artificial intelligence in quality control: Transforming manufacturing processes,” Journal of Computer Science, vol. 22, pp. 25–35, 2026.

“Artificial intelligence in high-tech manufacturing: A review of applications in quality control and process optimization,” ResearchGate, preprint, 2022.

“Artificial intelligence in high-tech manufacturing: A review of applications in quality control and process optimization,” International Journal of Innovative Research in Engineering & Multidisciplinary Physical Sciences (IJIRMPS), vol. 14, no. 3.

D. Mazzei and R. Ramjattan, “Machine learning for Industry 4.0: A systematic review using deep learning-based topic modelling,” Sensors, vol. 22, no. 22, Art. no. 8641, 2022.

M. Ghobakhloo, “Industry 4.0, digitization, and opportunities for sustainability,” Journal of Cleaner Production, vol. 252, Art. no. 119869, 2020.

“State of the art in AI-based visual inspection for industrial quality control: Methods, benchmarks, challenges, and autonomous systems,” Electronics, vol. 15, no. 12, Art. no. 2727, 2026.

“Surface defect detection methods based on deep learning: A brief review,” in Proc. IEEE Conf., 2021.

P. M. Bhatt, R. K. Malhan, P. Rajendran, B. C. Shah, S. Thakar, Y. J. Yoon, and S. K. Gupta, “Image-based surface defect detection using deep learning: A review,” Journal of Computing and Information Science in Engineering, vol. 21, no. 4, 2021.

“Generative adversarial networks to improve the robustness of visual defect segmentation by semantic networks in manufacturing components,” Applied Sciences, vol. 11, no. 14, Art. no. 6368, 2021.

“Generative adversarial networks for synthetic defect generation in assembly and test manufacturing,” in Proc. IEEE Conf.

“Artificial intelligence (AI) in pharmaceutical formulation and dosage calculations,” PMC, Art. no. PMC12655709, 2025.

“Explainable AI-driven quality and condition monitoring in smart manufacturing,” Sensors, vol. 26, no. 3, Art. no. 911, 2026.

“A systematic literature review on artificial intelligence and explainable artificial intelligence for visual quality assurance in manufacturing,” ResearchGate, preprint, 2023.

“Predictive maintenance using machine learning: A case study in manufacturing management,” in Proc. IEEE Conf., 2023.

“Research on milling machine predictive maintenance based on machine learning and SHAP analysis in intelligent manufacturing environment,” arXiv preprint arXiv:2512.01205, 2025.

“Machine learning algorithms for predictive maintenance in manufacturing,” Journal of Technology and Systems, 2024.

“A systematic review of deep learning approaches for surface defect detection in industrial applications,” Engineering Applications of Artificial Intelligence, vol. 126, Art. no. 107717, 2023.

“Research on printed circuit board (PCB) defect detection algorithm based on convolutional neural networks (CNN),” Applied Sciences, vol. 15, no. 24, Art. no. 13115, 2025.

“PCB defect recognition by image analysis using deep convolutional neural network,” Journal of Electronic Testing: Theory and Applications, 2024.

“A novel MAS-GAN-based data synthesis method for object surface defect detection,” Neurocomputing, 2022.

“Generative adversarial network-based synthetic data training model for lightweight convolutional neural networks,” Multimedia Tools and Applications, 2023.

“Generative defect synthesis for enhancing industrial anomaly detection,” in Proc. CVPR Workshops, 2025.

“Unveiling the unseen: A comprehensive survey on explainable anomaly detection in images and videos,” arXiv preprint arXiv:2302.06670, 2023.

MVTec Software, “MVTec AD: Anomaly detection benchmark dataset,” 2026.

P. Bergmann, K. Batzner, M. Fauser, D. Sattlegger, and C. Steger, “The MVTec anomaly detection dataset: A comprehensive real-world dataset for unsupervised anomaly detection,” International Journal of Computer Vision, 2021.

“A survey on RGB, 3D, and multimodal approaches for unsupervised industrial image anomaly detection,” arXiv preprint arXiv:2410.21982, 2024.

S. Ravikumar, K. I. Ramachandran, and V. Sugumaran, “Machine learning approach for automated visual inspection of machine components,” Expert Systems with Applications, vol. 38, no. 4, pp. 3260–3266, 2011.

E. Cumbajin, N. Rodrigues, P. Costa, R. Miragaia, L. Frazão, N. Costa, A. Fernández-Caballero, J. Carneiro, L. H. Buruberri, and A. Pereira, “A systematic review on deep learning with CNNs applied to surface defect detection,” Journal of Imaging, vol. 9, no. 10, Art. no. 193, 2023.

“Semiconductor wafer map defect classification using convolutional neural networks on imbalanced classes,” in Proc. IEEE Conf.

“An efficient industrial defect detection based on hybrid residual attention with modified generative adversarial network and convolutional neural network model,” Computers & Electrical Engineering, 2025.

“Unsupervised continual anomaly detection with contrastively-learned prompt,” arXiv preprint arXiv:2401.01010, 2024.

“XEdgeAI: A human-centered industrial inspection framework with data-centric explainable edge AI approach,” Information Fusion, 2024.

“Architecture-aware explanation auditing for industrial visual inspection,” arXiv preprint arXiv:2605.14255, 2026.

“Explainable AI for visual inspection: A comparative analysis and review,” Journal of Visualized Experiments, 2025.

“Adaptive explainable artificial intelligence for visual defect inspection,” Procedia Computer Science, 2024.

“Artificial intelligence in biopharmaceutical quality management systems,” BioProcess International, 2025.

F. Chen, L. Fu, Y. Zhang, J. Li, Q. Zhang, and S. Bi, “A review of deep learning-based steel surface defect detection,” Academic Journal of Science and Technology, vol. 15, no. 1, pp. 198–202, 2025.

“A survey of real-time surface defect inspection methods based on deep learning,” Artificial Intelligence Review, 2023.

“Mathematical and algorithmic advances in machine learning for statistical process control: A systematic review,” Entropy, vol. 28, no. 2, Art. no. 151, 2026.

“PCB defect detection using denoising convolutional autoencoders,” arXiv preprint arXiv:2008.12589, 2020.

“Defect detection network in PCB circuit devices based on GAN-enhanced YOLOv11,” arXiv preprint arXiv:2501.06879, 2025.

“Predictive maintenance using machine learning,” arXiv preprint arXiv:2205.09402, 2022.

“Industry 4.0 and its importance in statistical process control,” in Proc. International Conference on Industrial Engineering and Operations Management, 2023.

“Statistical process control with intelligence based on the deep learning model,” Applied Sciences, vol. 10, no. 1, Art. no. 308, 2019.

“Integrating SPC 4.0 and machine learning for predictive quality management in smart manufacturing,” Efficiens: Journal of Management Science and Operations, 2025.

“Industry 4.0 and smart systems in manufacturing: Guidelines for the implementation of a smart statistical process control,” Smart Cities, vol. 7, no. 2, Art. no. 24, 2024.

“Statistical process control (SPC) for quality management in Industrie 4.0: A literature review,” in Proc. IEEE Conf.

MVTec Software, “MVTec AD 2: Advanced industrial anomaly detection dataset,” 2026.

“The MVTec 3D-AD dataset for unsupervised 3D anomaly detection and localization,” arXiv preprint arXiv:2112.09045, 2021.

Y. Tu, Z. Ling, S. Guo, et al., “An accurate and real-time surface defects detection method for sawn lumber,” IEEE Transactions on Instrumentation and Measurement, vol. 70, pp. 1–11, 2020.

K. Taha, “Observational and experimental insights into machine learning-based defect classification in wafers,” arXiv preprint arXiv:2310.10705, 2023.

“Artificial intelligence for quality defects in the automotive industry: A systemic review,” PMC, Art. no. PMC11902312, 2025.

“Artificial intelligence in quality control systems: A cross-industry analysis of applications, benefits, and implementation frameworks,” ResearchGate, preprint, 2024.

K. H. Ang et al., “Deep learning-based silicon wafer defect classification: A performance comparison of pretrained networks,” in Advances in Intelligent Manufacturing and Robotics (ICIMR 2023), Lecture Notes in Networks and Systems, vol. 845, 2024.

U. Batool, M. I. Shapiai, M. Tahir, Z. H. Ismail, N. J. Zakaria, and A. Elfakharany, “A systematic review of deep learning for silicon wafer defect recognition,” IEEE Access, vol. 9, pp. 116572–116593, 2021.

“Defect detection and classification on semiconductor wafers using two-stage geometric transformation-based data augmentation and SqueezeNet lightweight convolutional neural network,” Computers & Industrial Engineering, 2023.

“Deep learning-driven silicon wafer defect segmentation and classification,” ScienceDirect, 2025.

“Revolutionizing pharma: Unveiling the AI and LLM trends in the pharmaceutical industry,” arXiv preprint arXiv:2401.10273, 2024.

“Artificial intelligence in personalized nutrition and food manufacturing: A comprehensive review of methods, applications, and future directions,” PMC, Art. no. PMC12325300, 2025.

“Machine learning for quality control in the food industry: A review,” PMC, Art. no. PMC12523314, 2025.

“AI-driven quality control in manufacturing and construction: Enhancing precision and reducing human error,” ResearchGate, preprint, 2025.

“A comprehensive review of research on surface defect detection of PCBs based on machine vision,” ScienceDirect, 2025.

“A deep learning approach for automated PCB defect detection: A comprehensive review,” Multidisciplinary Reviews.

“Uneven illumination surface defects inspection based on convolutional neural network,” arXiv preprint arXiv:1905.06683, 2019.

“PCB defect detection using convolutional autoencoders,” International Journal of Research and Analytical Reviews.

“Improved wafer defect pattern classification in semiconductor manufacturing using deep learning and explainable AI,” Springer Nature, 2025.

“Wafer defect detection and classification in semiconductor manufacturing,” Nature Index Topics.

“Artificial intelligence-driven pharmaceutical industry: A paradigm shift in drug discovery, formulation development, manufacturing, quality control, and post-market surveillance,” ScienceDirect, 2024.

“Transforming pharmaceutical quality assurance and validation through artificial intelligence,” AI Health, 2025.

“Impact of artificial intelligence on improving pharmaceutical quality assurance systems,” International Journal of Pharmaceutical Sciences, 2026.

“The pharmaceutical industry's future: How artificial intelligence is transforming medicine,” PMC, Art. no. PMC12703384, 2025.

“Advancements and applications of artificial intelligence in pharmaceutical sciences: A comprehensive review,” PMC, Art. no. PMC11787549, 2025.

“Artificial intelligence in pharmaceutical technology and drug delivery design,” PMC, Art. no. PMC10385763, 2023.

“Artificial intelligence and Internet of Things integration in pharmaceutical manufacturing: A smart synergy,” PMC, Art. no. PMC11944607, 2025.

“Artificial intelligence-based smart quality inspection for manufacturing: Leveraging artificial intelligence for quality compliance—A comprehensive review in the smart manufacturing context,” ResearchGate, preprint, 2023.

“A survey of defect detection applications based on generative adversarial networks,” preprint repository, 2025.

Downloads

Published

2026-08-15

How to Cite

Abdullah , M. A., Taher , A. J., & Abdullah , T. H. (2026). ARTIFICIAL INTELLIGENCE IN QUALITY CONTROL: A REVIEW OF METHODS, APPLICATIONS, AND EMERGING DIRECTIONS. Kyzylorda Scholarly Review, 3(2), 197–208. Retrieved from https://bulletin.ouk.kz/index.php/bulletin/article/view/74